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Fischione 1040 NanoMill

Photo of NanoMill TEM


Contact:
Alex Kvit
kvit@wisc.edu
608-265-4458












  • Ultra-low energy ion source
  • Concentrated ion beam
  • Removes amorphous and implanted layers
  • Ideal for post-focused ion beam processing and milling of conventionally prepared specimens
  • Liquid nitrogen-cooled specimen stage